Testing of Decoupling Capacitors in Computer Circuitry
Original Publication Date: 1988-Aug-01
Included in the Prior Art Database: 2005-Feb-15
The capacitors of a group of parallel-connected capacitors, whose dielectric exhibits a capacitive reactance change with temperature, are tested individually by sequentially heating each of them, e.g., by means of a stream of hot gas directed thereon, and by simultaneously determining whether a change in the charge time of the whole group of capacitors is induced. No such change will occur if the capacitor is disconnected. The high commutation rate of the integrated circuits used today in computer circuitry requires the presence of decoupling capacitances between the voltage planes of the cards on which these integrated circuits are mounted. This is conventionally achieved by providing decoupling capacitors near every integrated circuit.