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Scanning Tunneling Microscope Using Magnetic Deflection

IP.com Disclosure Number: IPCOM000058058D
Original Publication Date: 1988-Aug-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
Stoll, E [+details]

Abstract

Usually, scanning tunneling microscopes use piezoelectric elements to position the tunneling tip over the sample area to be investigated. Accuracy of the images obtained may be impaired through effects related to the first-order phase transitions of the piezoelectric elements, such as 1/f noise, hysteresis, creeping, etc. These disadvantages are avoided by a magnetic deflection unit carrying the tunnel tip. A tube 1 (Fig. 1), such as a metallic tube, is fixed at one end 2 and has a ferrite kernel 3 inside the other end 4 which carries the tunneling tip 5. Kernel 3 is magnetized parallel to the axis of tube 1. A plurality of coils 6 is arranged about the circumference of tube 1. By appropriately applying electrical current to coils 6, the tube can be bent or stretched in any desired direction. Fig.