Browse Prior Art Database

Zero Insertion Force Connector Forward Wipe Measurement Device

IP.com Disclosure Number: IPCOM000058098D
Original Publication Date: 1988-Aug-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
Babuka, R Beaudry, J Meyers, K Petrozello [+details]

Abstract

The arrangement herein shown and described provides an improved wipe measurement device for measuring the forward wipe of a zero insertion force connector (ZIF). The wipe is measured directly while in the actual package. In the past, contact wipe of a ZIF connector has been measured by optically measuring the wipe scar length on the contact pad, and is both inaccurate and time consuming. The present arrangement comprises a rigid test card 1, for example, of steel or other relatively rigid material, having a gold- plated tab area 2, positioned at the base of the card as shown in Fig. 1. Locating notches 3 and 4 register the card against the two ZIF connector locating pins 5 situated at the rear of the connectors.