Software for Determining Vil/Vih Testability for Digital Devices on Sentry Series of Testers
Original Publication Date: 1988-Oct-01
Included in the Prior Art Database: 2005-Feb-15
This article describes a program which can reduce the voltage input low (VIL)/voltage input high (VIH) test development time from many hours down to a few minutes. It allows the high-speed capabilities of the Sentry 21 (S21) tester to perform the same work that would be performed by a test engineer manually typing commands at a terminal. The evaluation of electrical components often involves the writing of specific test code to evaluate VIL and VIH input voltages for a device. S21 time constraints require that the test code be written in such a way that input pins are tested in groups instead of as individual pins. One hazard of testing input pins in groups is that these functionally operational pins may be "masked" out by the test vectors.