Browse Prior Art Database

Off Chip Receiver for Multi-chip Module Testing

IP.com Disclosure Number: IPCOM000058870D
Original Publication Date: 1988-Jan-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
LeBlanc, J Storey, TM Yoder, JW [+details]

Abstract

With current chip in place test (CIPT) module testing methods, testing one chip on a module containing many chips involves dedication of one I/O per pin chip. On current state-of-the-art modules that may involve the use of 15 or more module I/O pins.