Browse Prior Art Database

Fixture for Chip-In-Place Testing of Multi-Chip Semiconductor Modules

IP.com Disclosure Number: IPCOM000059053D
Original Publication Date: 1988-Apr-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
Beckham, HR Shah, IJ [+details]

Abstract

Chip-in-place testing (CIPT) of semiconductor multi-chip modules (MCM's) utilizing existing probers is enhanced by the addition of a fixture to hold a MCM assembly.