Quick Test for Stuck Bits in A/D Converter Outputs
Original Publication Date: 1988-May-01
Included in the Prior Art Database: 2005-Feb-15
This disclosure describes a method of locating stuck bits in the digital data path following a 2's complement analog-to-digital converter (ADC). The advantage of this method is that stuck bits can be identified very quickly. High accuracy is not required in either the ADC or test signal and all output bits are checked.