Robot Gripping Force Test Fixture
Original Publication Date: 1988-May-01
Included in the Prior Art Database: 2005-Feb-15
This article discloses a method of measuring the gripping forces of the industrial robots used in semiconductor manufacture. The test fixture 10 as shown in side view in the figure is comprised of table plate 12, which serves as foundation for the test fixture; bearings 14 which provide a low friction surface for pressure tip plate 16; and the base plate 18. Plates 12, 16 and 18 may slide/move relative to each other when acted on by an outside/external force, such as robot gripper 20.