Browse Prior Art Database

Detection of Printed Circuit Neckdowns With High Current/ Resistance Monitoring

IP.com Disclosure Number: IPCOM000059156D
Original Publication Date: 1988-Jun-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
Frushour, JE [+details]

Abstract

A high current test applies a high amplitude current pulse to burn open catastrophic height/width reductions on printed circuit lines. Occasionally a line reduction with a marginal cross sectional area will not burn open but melt and reflow in such a manner as to be of questionable reliability. A method of detecting this height/width reduction or neckdown is as follows.