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A sensitive high resolution device for detecting surface magnetic flux force on a magnetic surface is disclosed.
English (United States)
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Surface Magnetic Flux Force Detector
A sensitive high resolution device for detecting surface magnetic flux force on
a magnetic surface is disclosed.
The detector comprises a probe made of an appropriate high temperature
superconducting material. It replaces the surface probe tip of an Atomic Force
Microscope (AFM). The probe of magnetic flux force detector is sensitive to the
magnetic field distribution near and at the surface of the material, whereas the
probe of the AFM is sensitive to its electrical interaction with the surface. The
magnetic interaction between the proposed probe and flux occurs via the
Meissner Effect. The resolution of the detector is comparable to the AFM, which
is of the order of 50 angstroms.
This device can be used to detect and display the distribution of the magnetic
field at or near the surfaces of materials such as disks and heads. Resolution is
far higher than that in instruments used at present, and may be used for ultra
high resolution magnetic reading purposes in direct access storage.