Browse Prior Art Database

Non-Contact Testing

IP.com Disclosure Number: IPCOM000059245D
Original Publication Date: 1988-Jul-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
Carolina, R Colton, R Sternbach, I [+details]

Abstract

As very large scale integration continues to decrease the size of components, the components become physically weaker and less able to support mechanical contact. The figures show two systems for minimizing or eliminating contact during the testing of a resistive conductor or load R.