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Test Fixture With Programmable Probes Disclosure Number: IPCOM000059368D
Original Publication Date: 1988-Sep-01
Included in the Prior Art Database: 2005-Feb-16

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Related People

Cadigan, MJ Fuller, JW, Jr Thomas, LE [+details]


A test fixture 10 has an insulator substrate 11 that is provided with a universal array of openings 12, and removable spring- loaded telescopic conductive pins 13 that are selectively press- fit inserted into predetermined locations of the openings 12 in a pattern which matches those of the test sites on the workpiece.