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Test Fixture With Programmable Probes

IP.com Disclosure Number: IPCOM000059368D
Original Publication Date: 1988-Sep-01
Included in the Prior Art Database: 2005-Feb-16

Publishing Venue

IBM

Related People

Authors:
Cadigan, MJ Fuller, JW, Jr Thomas, LE [+details]

Abstract

A test fixture 10 has an insulator substrate 11 that is provided with a universal array of openings 12, and removable spring- loaded telescopic conductive pins 13 that are selectively press- fit inserted into predetermined locations of the openings 12 in a pattern which matches those of the test sites on the workpiece.