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ESD (Electrostatic Discharge) Test Method for Component of a Larger System

IP.com Disclosure Number: IPCOM000059452D
Original Publication Date: 1988-Oct-01
Included in the Prior Art Database: 2005-Feb-16

Publishing Venue

IBM

Related People

Authors:
Corcoran, PM Soohoo, KM Weidle, B [+details]

Abstract

A system component, such as a circuit card with several circuit modules, is tested during development for its susceptibility to ESD when it is later used as part of a system. Some system components may be poorly shielded by the system enclosure and some components such as high gain circuits are particularly susceptible to ESD. As is conventional in ESD testing, a capacitor is charged to a selected voltage and then discharged across an arc-producing component called a probe. The test simulates various sources of electrical interference, for example, the discharge that frequently occurs when a person walks across a rug in dry weather.