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Positive Cycle Detection in Compaction Graphs

IP.com Disclosure Number: IPCOM000059546D
Original Publication Date: 1988-Dec-01
Included in the Prior Art Database: 2005-Feb-16

Publishing Venue

IBM

Related People

Authors:
Posluszny, SD [+details]

Abstract

Silicon compilation and compaction is very much employed in semiconductor IC chip design work. Conflicts occurring between design groundrules and user input constraints in such work are a cause of compaction failure and are referred to as positive cycles in the compaction graph. The algorithm described in this article quickly and automatically finds the positive cycle, leading to its early isolation and correction.