Positive Cycle Detection in Compaction Graphs
Original Publication Date: 1988-Dec-01
Included in the Prior Art Database: 2005-Feb-16
Silicon compilation and compaction is very much employed in semiconductor IC chip design work. Conflicts occurring between design groundrules and user input constraints in such work are a cause of compaction failure and are referred to as positive cycles in the compaction graph. The algorithm described in this article quickly and automatically finds the positive cycle, leading to its early isolation and correction.