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Quality Control Test for Multi-Layer Ceramic I/O Pin Strength

IP.com Disclosure Number: IPCOM000059549D
Original Publication Date: 1988-Dec-01
Included in the Prior Art Database: 2005-Feb-16

Publishing Venue

IBM

Related People

Authors:
Fu, Y Guan, DY [+details]

Abstract

It is proposed to use liquid N2 to cool I/O pins on multi-layer ceramic substrates to a sub-ambient temperature prior to conducting a conventional pull test. The method is a more accurate way to determine the adequacy of the pin to substrate braze joint strength.