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A method is described for increasing the reliability of a control circuit which is implemented using CMOS technology.
English (United States)
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Increasing Reliability of CMOS Control Circuits
A method is described for increasing the reliability of a control circuit which is
implemented using CMOS technology.
The current method of preventing circuit damage at extended temperatures is
to automatically power off the system until the temperature has decreased to a
safe operating range. This can cause serious problems when the control circuit
performs a critical function.
The preferred alternative is to keep the system in a state of thermal
equilibrium, so that there is no need to power off the circuit. This can be done
because the switching frequency of a CMOS device has a linear effect on the
power consumption of the device. In addition, the forward bias of a
semiconductor diode changes linearly with the temperature. The forward bias
change can be used to control the input to a voltage controlled oscillator. This
output frequency would be used as a clocked control signal for the CMOS circuit.
The result is that as the temperature increases, the power consumption of the
CMOS circuits will decrease and allow for safe operation of the device by
maintaining the thermal equilibrium.
The method is useful when implemented in a priority based computer system.
It will assure that when the temperature increases and less computation cycles
are available, the highest priority requirements are handled before those of a