Browse Prior Art Database

AC TEST Performance in a DC Functional Tester

IP.com Disclosure Number: IPCOM000059629D
Original Publication Date: 1986-Jan-01
Included in the Prior Art Database: 2005-Mar-08

Publishing Venue

IBM

Related People

Authors:
Desrosiers, B Peter, JL Sitbon, C Steimle, A [+details]

Abstract

This article relates to the design of an AC card which is supplied by external generators and tester signals to provide synchronized AC clocks to a unit to be tested. This allows AC test to be performed on a DC tester. The unit to be tested is a floating-point processor making use of two different clocks, namely, BUS CLOCKS which control all input/output communication interfaces of the unit and SYSTEM CLOCKS which control all transfers using only internal paths of the unit. The unit is tested at real speed on a standard DC tester by applying the BUS and SYSTEM CLOCKS in a synchronous manner. The card designed for this purpose is supplied by two external pulse generators and two tester signals.