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I2L Memory Cell Disclosure Number: IPCOM000059643D
Original Publication Date: 1986-Jan-01
Included in the Prior Art Database: 2005-Mar-08

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Knepper, RW Wong, RC [+details]


An I2L memory cell, shown in Fig. 1, has two performance limitations: (1) the sensing signal is relatively weak, and (2) cell stability is sensitive to bit line offset. There have been various proposals to overcome these conditions, one of which is shown in Fig. 2. TA, TB serve as read/write devices and operate in the normal mode during select. The normal current gain of TA and TB determines the speed of read/write operations. If b is small, read is slow and write is fast. If b is large, read is fast and write is slow. b can be adjusted by emitter-junction depth and dopant concentration. An I2L cell can be implanted with the integrated device of Figs. 3, 4 and 5. The advantage over the Fig. 2 cell is that a common process may be employed for both memory and logic.