Original Publication Date: 1986-Feb-01
Included in the Prior Art Database: 2005-Mar-08
This article relates to an electronic load EL for drawing a desired load current from a power supply for the automated testing of the latter. As shown in Fig. 1, the electronic load consists of a series of metal-oxide semiconductor field-effect transistors (MOSFETs). The total load current IL, drawn from the power supply under test (PSUT), is controlled by a control unit CU which may form part of a microprocessor. For each binary weight, unit CU supplies a gate control signal d0 to d7 to eight MOSFETs MF0 to MF7. For low-order signals, one MOSFET, such as MF0, is provided for each weight, whereas for high-order signals, it may be necessary to connect two or more MOSFETs, such as MF7A and MF7B, in parallel, if the current controlled by the respective weight exceeds the maximum admissible MOSFET current.