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High Level Language for Creating Analog TEST System Programs

IP.com Disclosure Number: IPCOM000060154D
Original Publication Date: 1986-Mar-01
Included in the Prior Art Database: 2005-Mar-08

Publishing Venue

IBM

Related People

Authors:
Jordan, DL [+details]

Abstract

A high level input language and test data supply system for creating test programs adaptable to a variety of semiconductor chip testers is described. The main driving software is tester independent with calls to user-defined subroutines in the syntax of the tester being addressed. This language conveys the general test conditions via a word processor, e.g., TSO (Time Sharing Option), to create a standard 80- character data set similar to old card input languages, e.g., columns 1-72 for data and 73-80 for normal TSO dataset statistics and line numbers. The input allows for liberal use of blanks and comments for readability and clarification, with general keywords and delimiters to define the testing to be done.