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Detection of Skew and Shift of CCD Sensor Array

IP.com Disclosure Number: IPCOM000060162D
Original Publication Date: 1986-Mar-01
Included in the Prior Art Database: 2005-Mar-08

Publishing Venue

IBM

Related People

Authors:
Ishikawa, Y [+details]

Abstract

This article describes a technique for detecting skew and shift of a one-dimensional charge coupled device (CCD) sensor array from its nominal mounting position. A composite test pattern consisting of a sawtooth-like pattern and two vertical bars provided at the opposite ends of the sawtooth-like pattern is used. The composite test pattern enables quantitative measurement of skew and shift of the CCD sensor array. Fig. 1 illustrates the present test arrangement. Test chart 2 has a composite test pattern consisting of a sawtooth-like pattern 3 and two vertical bars 4 provided at the opposite ends of the sawtooth-like pattern 3. Under illumination by light source l, the test pattern is sensed by one-dimensional sensor array 6 through lens system 5. Fig.