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A Flexible Z-Axis Compression Test Head

IP.com Disclosure Number: IPCOM000060264D
Publication Date: 2005-Feb-16

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for a test probe that provides Z-axis compression during the testing of devises, such as CPU sockets after board assembly. Benefits include a solution with the ability to simultaneously test multiple contact nets or arrays with one contact cycle.