Tailorable Bring-Up Diagnostics for a Featurable Workstation
Original Publication Date: 1986-Apr-01
Included in the Prior Art Database: 2005-Mar-08
Through the use of Non-Volatile RAM (NVRAM), a workstation can be configured to run specific feature diagnostics each time power is turned on. The configuration is updated directly by the operator through a select option utility and can be used to bypass a feature with known problems or a feature whose diagnostic tests may be time consuming to run every time the workstation is powered on. NVRAM storage is allocated to store test status flags. These flags are updated via a ROM-resident select option invoked by the operator. As shown in Fig. 1, each status flag represents a specific feature. Later, when the "Feature Diagnostic Driver" runs, the status flags are tested one at a time. If the bit corresponding to any feature is active, that feature diagnostic will be invoked each time the workstation is powered on.