Browse Prior Art Database

A Method of Fast Respond for Testing Asynchronous Memory And I/o Devices

IP.com Disclosure Number: IPCOM000060614D
Original Publication Date: 1986-Mar-01
Included in the Prior Art Database: 2005-Mar-08

Publishing Venue

IBM

Related People

Authors:
Scott, EW [+details]

Abstract

This circuit will compensate for tester and/or device delays by storing test data in a shift register and sending it out to the device under test.