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A Method of Fast Respond for Testing Asynchronous Memory And I/o Devices Disclosure Number: IPCOM000060614D
Original Publication Date: 1986-Mar-01
Included in the Prior Art Database: 2005-Mar-08

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Scott, EW [+details]


This circuit will compensate for tester and/or device delays by storing test data in a shift register and sending it out to the device under test.