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Wet Film Thickness Gage

IP.com Disclosure Number: IPCOM000060645D
Original Publication Date: 1986-Apr-01
Included in the Prior Art Database: 2005-Mar-09

Publishing Venue

IBM

Related People

Authors:
Garcia, J Woodard, HR [+details]

Abstract

A standard micrometer depth gage can be modified to permit its use in measuring the thickness application of wet pastes or other films applied to substrates. As shown in the drawing, the modified device includes a conventional micrometer depth gage 11 having an optically flat quartz disk 12 mounted on the lower end thereof. This assembly may be mounted in a zero-adjust stand 13 which permits calibration for zero film thickness prior to placing the lower surface of the optically flat member 12 in contact with the film whose thickness is to be measured. The resulting measured thickness can be read directly from the micrometer scale.