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Coincidence Technique in Scanning Electron Microscopes

IP.com Disclosure Number: IPCOM000060699D
Original Publication Date: 1986-Apr-01
Included in the Prior Art Database: 2005-Mar-09

Publishing Venue

IBM

Related People

Authors:
Jenkins, KA [+details]

Abstract

This publication describes a technique for the suppression of accidental noise in very low intensity Scanning Electron Microscopes (SEM).