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Spot Centering for a Semiconductor Laser

IP.com Disclosure Number: IPCOM000060990D
Original Publication Date: 1986-Jun-01
Included in the Prior Art Database: 2005-Mar-09

Publishing Venue

IBM

Related People

Authors:
Block, TR Kobliska, DC Soderstrom, RL [+details]

Abstract

A semiconductor laser spot-centering technique is used to locate and focus a laser beam under computer control. The test defines an optical home position in the x, y, and z axes for the center of a beam of energy being emitted from the front facet of a semiconductor laser independent of mechanical package and chip-placement tolerances. The test station employed is outlined in Fig. 1. The laser position is controlled in three axes by automated translation stages of one-micron accuracy. The laser beam 10 is collimated and directed at a silicon quadrature detector 11. Each quadrant output is directed to a relay scanner and switchable to a digital voltmeter for monitoring relative intensities.