Module Chipsite Partial EC Capability
Original Publication Date: 1986-Jul-01
Included in the Prior Art Database: 2005-Mar-09
This technique provides increased chip and circuit density on a given module substrate size without the potential scrap and long turnaround time for a replacement change associated with a zero engineering change (EC) capability design. Current multichip packages employ full EC capability designs which require large surface areas devoted to EC pads and routing tracks for discrete wire utilized to change logical function or wire routing. This large area requirement reduces the potential chip capacity of a given substrate size and thereby lowers the circuit density of the package. The decrease in circuit density is reflected in longer wiring paths and therefore lower performance of the packaged electronics. A potential solution to this problem is the elimination of the EC capability and the area associated with the EC function.