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Application of Micro-Kerr Measurement Technique for Monitoring and Characterizing Magnetic Thin-Film Wafers and Similar Structures

IP.com Disclosure Number: IPCOM000061239D
Original Publication Date: 1986-Jul-01
Included in the Prior Art Database: 2005-Mar-09

Publishing Venue

IBM

Related People

Authors:
Bartels, C Robbel, G [+details]

Abstract

It is known from the literature to observe magnetic domains and their switching behavior under the influence of an induced magnetic field by means of the magneto-optical kerr (Micro-Kerr) effect. Micro-Kerr permits making domain patterns visible by photographic and/or video techniques. It has been found that domain patterns are correlated with the magnetic read/write performance of thin-film heads. Micro-Kerr may therefore be used as a test means at an early stage in the production of thin-film magnetic heads to monitor single magnetic layers as well as completed head elements. It may also be used for other magnetic components or parts thereof.