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Accurate Propagation Delay Time Measurement

IP.com Disclosure Number: IPCOM000061517D
Original Publication Date: 1986-Aug-01
Included in the Prior Art Database: 2005-Mar-09

Publishing Venue

IBM

Related People

Authors:
Ayers, RL [+details]

Abstract

Programmed tester comparator devices are utilized for testing integrated circuit elements and modules. One problem with testing is that the drive voltage response of the tester is a function of the load imposed by the device under test. Variations in driver delay are not accounted for in normal device waveform propagation delay time measurements performed in such testers. The present testing technique accounts for driver slew rate differences between testers and due to changes that occur when the device load is imposed. The propagation delay time of the driver under load is subtracted from the overall propagation delay time of the device under test to achieve an adjusted propagation delay time for the device itself regardless of the driver or the load. Fig.