High-Frequency Test Mode
Original Publication Date: 2005-Feb-17
Included in the Prior Art Database: 2005-Feb-17
Disclosed is a high-frequency test mode capable of testing memory chips at frequencies greater than 1GHz using slow testers. The solution does not require DLL-based on-chip clock multiplication and BIST engines for address, data generation and data compare. Direct memory access is preserved and the accuracy and range of the internal cycle time is improved.