Method for Enabling Multiple Repair Options with Differential e-Fuse
Original Publication Date: 2005-Feb-17
Included in the Prior Art Database: 2005-Feb-17
Disclosed is a method that enables multiple repair options with differential e-fuse. Programmable registers are used to disable the evaluation of groups of fuse banks (later to be used for module or field repairs) prior to testing or burn-in the memory arrays. The programmable registers may be integrated within a BIST or JTAG controller. Upon power-up, these registers are reset to enable all wafer and module-level fuse banks to be utilized. Thus, the application does not require any special power-up protocols to activate the programmable registers and all fuse elements are operable. Prior to the execution of functional patterns during wafer test or burn-in, the programmable registers can disable spare fuse banks (which will be blown a later stage) and full testing is achieved with unblown fuse banks.