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Interactive Integrated Circuit Design and Test System

IP.com Disclosure Number: IPCOM000062147D
Original Publication Date: 1986-Oct-01
Included in the Prior Art Database: 2005-Mar-09

Publishing Venue

IBM

Related People

Authors:
Booker, G Carter, J Corson, P Masenas, C Massetti, M Towler, F Wilder, D [+details]

Abstract

A system is described which extends the use of existing automated circuit design, mask layout data, and circuit simulation of integrated circuits. Physical and electrical characteristics of an actual circuit are compared with characteristics derived from design and simulation. Actual electrical circuit characteristics are acquired from a stroboscopic electron beam tester (SEBT) integrated within this system. The interactive search, view, and test capability of the system is used in verification of new integrated circuit designs. The system provides ability to automatically check and verify electrical characteristics of actual devices with characteristics predicted by simulation and to subsequently flag and display any variances.