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Electron Beam Pulsing by Optoelectronically Switched Electron Gun

IP.com Disclosure Number: IPCOM000062361D
Original Publication Date: 1986-Nov-01
Included in the Prior Art Database: 2005-Mar-09

Publishing Venue

IBM

Related People

Authors:
Jenkins, KA [+details]

Abstract

In stroboscopic electron beam testing, the time resolution is determined by the length of the electron beam pulse and the control of its start time. Conventional electrostatic beam chopping can be used to make pulses about one nanosecond long; shorter pulses can only be obtained with great difficulty [1]. Also, simple beam chopping reduces the net usable beam by the duty cycle. The technique described herein will easily make pulses as short as 100 picoseconds, with excellent control of the start time, and gives 10 or more times the beam intensity of conventional chopping. The technique uses pulsed voltages on both the Wehnelt grid and the anode of a typical electron gun, as shown in the drawing.