Programmable, High Speed, 50-Ohm, Pulse Driver
Original Publication Date: 1986-Nov-01
Included in the Prior Art Database: 2005-Mar-09
A multi-level pulse driver is described which is useful in semiconductor device testing. This driver features the ability to pre-program a continuous train of pulses each of which may have a different predetermined voltage level anywhere between the limits of +5.5 and -5.5 volts at cycle times of less than 20 nanoseconds. The driver has a 50-ohm output impedance and a 10-nanosecond delay from input to output. The driver incorporates manual time skew adjustment on leading and trailing edges of pulses for precise delay and width alignment between drivers. Referring to the figure, information-defining pulse voltage levels are stored in random-access memories (RAMs) A and C. RAM A and RAM C are addressed via line 4 and data is transferred from Ram A to latch B or Ram C to latch D by means of select lines 1 and 2, respectively.