Best Solution Generator for Redundancy
Original Publication Date: 1986-Nov-01
Included in the Prior Art Database: 2005-Mar-09
This article relates to a technique for selecting the best replacement lines for faulty row and column lines in a two-dimensional redundant semiconductor memory array. Possible solutions for repairing random-access memories (RAMs) that are designed with spare rows and columns can be very large and illusive as the redundancy increases. Software algorithms that find most or all solutions for assigning replacement rows and columns in place of faulty ones are slow and the repair time is a function of the number of spares used. Once the best replacements have been chosen, the memory locations of the faulty lines are relocated in redundant columns or rows.