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Constant Voltage Circuit for Electromigration Testing

IP.com Disclosure Number: IPCOM000062884D
Original Publication Date: 1985-Jan-01
Included in the Prior Art Database: 2005-Feb-18

Publishing Venue

IBM

Related People

Authors:
Lin, R Rinaldi, JC [+details]

Abstract

In electromigration testing of stripes and contacts, it is essential to maintain constant current through the Device Under Test (DUT). Two kinds of circuits are commonly used. One problem with the constant current source design is the high voltage associated with the circuit when the number of devices in series is increased. Safety becomes a major concern. In addition, when the device resistance is increased, such as in contact stressing, the number of devices that can be handled by one current source is limited. For the constant voltage source design, the measuring resistor is small, normally close to that of the DUT. A pot is required to adjust the current for each device. Building bulky pot panels and fine tuning the current for each device are laborious.