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AC Parametric Test Generation Disclosure Number: IPCOM000063366D
Original Publication Date: 1985-Mar-01
Included in the Prior Art Database: 2005-Feb-18

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Bannon, RD Edwards, WT Handel, S Le, D Romero, CN Swindal, WN [+details]


This article describes a technique for utilizing a new high level interactive language for a processor which can automatically generate the factor test program. It is a quick and easy method to develop a time dependent (AC) parametric test which eliminates many hours of development and debugging time. The normal method of writing a program to test the AC parameters of component means starting from scratch to develop a program in factor language. Use of a high-level language to test the AC parameters as disclosed herein can eliminate many hours of development and debugging time. The high level language can be translated into factor programs, down loaded to the tester, and can execute the component test. Any corrections that need to be made are made in the high level program.