Browse Prior Art Database

Modification of 120-Pin Tester to Test Over 200-Pin Product

IP.com Disclosure Number: IPCOM000063893D
Original Publication Date: 1985-May-01
Included in the Prior Art Database: 2005-Feb-18

Publishing Venue

IBM

Related People

Authors:
Beckham, H Storey, T [+details]

Abstract

Problem Presently, when testing more than a 120-pin product on a 120-pin tester, a scheme is deployed which allows only half of the inputs and outputs to be observed in a single test section. In the past this was acceptable because all testing was done with this restriction. With the arrival of testers capable of 256-pin testing, a problem arises. Do we generate the tests assuming 120 pins or 200 pins? If we generate using the 120-pin scheme, we double pattern volume and test time and do not take advantage of the higher pin count tester. If we generate for the 200-pin test, we no longer can apply the tests on the 120-pin tester. Solution The solution is to modify the test data supply programs and performance board. Step 1: Identify the clock pins (this information is in the test data itself).