Browse Prior Art Database

Special Test Chip for Testing Ic Tester

IP.com Disclosure Number: IPCOM000064196D
Original Publication Date: 1985-Jun-01
Included in the Prior Art Database: 2005-Feb-18

Publishing Venue

IBM

Related People

Authors:
Alcorn, CN Beckham, HR Latham, DL [+details]

Abstract

Integrated circuit testers having a limited number of tester pins have been improved in the prior art by multiplexing the connection of the testers' test pins to two or more of the input/output pads on the integrated circuit chips to be tested. This has been described, for example, in [*]. A problem has arisen in the use of such multiplexed tester arrangements in testing the integrity of the electrical connections between the tester and the multiplexed I/O pads on the integrated circuit chips to be tested. If a short or open condition has occurred in one of the multiplexer switches between a tester pin and the integrated circuit pads, the only existing way to isolate and confirm the defective multiplexer switch is to disassemble the multiplexer.