Single-Cycle Test Mechanism for Logic Support Station and Functional Element
Original Publication Date: 1985-Jul-01
Included in the Prior Art Database: 2005-Feb-18
Auto-diagnostics are not run on interfaces between the internal diagnostic test logic and the system functional logic due to prior inability to concurrently control test logic data patterns and system clocking. The introduction of additional control logic on a single chip now allows for more versatile testing. Utilizing the control logic shown in the figure, the capability now exists to generate random test patterns in single-cycle mode or system mode.