Photoconductor Detector and Switch to Protect Integrated Circuits From Cosmic Ray-Induced Damage
Original Publication Date: 1985-Jul-01
Included in the Prior Art Database: 2005-Feb-18
This article relates to protection arrangements for integrated circuits and more particularly to protective devices for integrated circuits which are subject to cosmic ray-induced damage. Still more particularly, it relates to a photoconductor detector and switch which protect integrated circuits from cosmic rays in the space environment. This article discloses a photoconductor or a p-i-n diode to detect a Single Event Upset (SEU) in integrated circuit chips and to generate a signal to either temporarily depower the chip or take other corrective action. An SEU results from exposure of the chip to ionization radiation which, in turn, leads to the generation of large current which may either alter information in the chip or destroy it. Fig. 1.