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Apparatus for Automatic Non-Destructive Quality Testing of Plasma Panel Substrates

IP.com Disclosure Number: IPCOM000064633D
Original Publication Date: 1985-Aug-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Dias, WC [+details]

Abstract

A common failure for newly manufactured plasma display panels is a break or open in one or more of the grid wires on a substrate. An apparatus to perform computerized Time Domain Reflectometer testing of grid wires in plasma display devices operates as follows. Referring to the drawing, testing begins by placing the panel (not shown) on a positioning table 1 under control of the micro-computer 2, which positions the panel so that the first set of grid wires make contact with the probe 3. Except for the grid wire terminations, the probe is designed to contact three wires at any one time. The two outer wires are grounded by the probe to improve their transmission line properties, while the center wire is the wire under test.