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Compatible Rigid Probe

IP.com Disclosure Number: IPCOM000064923D
Original Publication Date: 1985-Sep-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Byrnes, HP Wahl, R [+details]

Abstract

A rigid probe has been suggested in place of the spring-type probes used with space transformers for high speed electrical testing of integrated circuits on a chip. Use of such probes would reduce the frequency of probe cleaning. This invention would use existing probe parts, but the contacts would be bonded to the lower die so as to act as rigid probes. As shown in Figs. 1 and 2, the probe consists of a housing, upper and lower dies and contacts. During assembly, the lower die is attached to the housing with contacts being inserted in it. The upper die is then slipped over the contact heads and attached to the housing.