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Realtime Measuring of Image Pattern Projections (0Œ, 45Œ, 90Œ, 135Œ)

IP.com Disclosure Number: IPCOM000065048D
Original Publication Date: 1985-Oct-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Akrout, C Linger, C [+details]

Abstract

The image processing devices operating by storing and processing images are detrimentally affected by (1) the great amount of memory to be used (for instance a 2000 x 2000-pixel (picture element) image requires the storage of 4000000 pixels and (2) the time delayed processing involves a very long processing time due to the addressing operations to be carried out to calculate the projections. Our invention consists in moving the image the projections of which are to be calculated, through a 18-line x 18-column analysis window (Fig. 1). This window should show the image of the most important defect. Thus, only 18 lines are stored, and processing is performed in realtime, at clock frequency. Principle of operation The electronic image is moved through a shifted word storage operating as shift registers (Fig. 2).