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Electrographic Gel Test for Surface Iron on Fracture Detection in Substrate Pins

IP.com Disclosure Number: IPCOM000065117D
Original Publication Date: 1985-Oct-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Harvilchuck, JM Ranalli, JR Rich, DW [+details]

Abstract

In ceramic substrate manufacturing, plated pins are inspected to detect any microfractures or surface iron (Fe) which could adversely affect functionality. This article proposes the use of a gel which provides much quicker turnaround time and significantly improved reliability versus those techniques conventionally in use. Conventional methods for detecting surface iron and microfractures include microprobe analysis and SEM (scanning electron microscope) analysis. The former has a high degree of reliability for Fe detection, but is quite time consuming. The SEM, as used for microfracture analysis, has only 50% reliability since it is a location-dependent technique. The gel test described in this article is fast, taking but 2-3 hours. It has a high degree of accuracy. It can detect as little as 1% surface Fe.