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Index Method for Test Pattern Reduction

IP.com Disclosure Number: IPCOM000065505D
Original Publication Date: 1985-Dec-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Bouldin, EA Guzowski, TS [+details]

Abstract

This index method is a process by which test sequences not contributing to the overall fault detection efficiency of an existing test set may be identified and eliminated. By producing a more compact test set, long test application times for level sensitive scan design (LSSD) logic tests are significantly reduced. The current LSSD test generation process is a non-iterative procedure; once tests are generated, no attempt is made to optimize them for test efficiency. This index method exploits information about one set of tests to create a smaller, more efficient second set by eliminating unnecessary tests. This reduction in the number of tests decreases the time required to apply them but does not reduce the test coverage.