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Detection And Method for Photothermal Deflection Spectroscopy

IP.com Disclosure Number: IPCOM000065617D
Original Publication Date: 1985-Mar-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Coufai, H Seki, H [+details]

Abstract

A detection method for photothermal (PT) deflection spectroscopy utilizes two coherent beams which probe the excited area of the sample and an adjacent unperturbed area of sample.