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Non-Invasive Tool for Coil Measurement

IP.com Disclosure Number: IPCOM000065655D
Original Publication Date: 1985-May-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Hannon, D Horne, D Santini, H [+details]

Abstract

A non-invasive tool for making measurements of thin film coil parameters during processing is shown.