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Systematic Substitution of Redundant Circuit Elements for Testing Purposes

IP.com Disclosure Number: IPCOM000065809D
Original Publication Date: 1985-Sep-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Langmaid, RN [+details]

Abstract

This article describes a circuit test mode that produces diffe- rent outputs for "Redundant Logic Elements" so that element evaluation can be achieved without "masking over" faulty circuit elements used in the circuit redundancies.